U6SF流程.
;All numbers between and "Sequence_Start" and "Sequence_end";are in hexadecimal form
; roll Eng_rev when there's a structural or major content change
; roll revision when there's a minor content change
Revision_number
major_rev 62
minor_rev 06
Eng_rev02
revision63
cspt_key8
spare 0
file_keyB
Sequence_Start:
4,7,C,10,15,1D,11,16,19,18,1A,13,1B,1C,1E,1F,8,33,6,B,D,20,30,E,39,34,31,35,3C,37,3E,22,21,14,26,27,25,3F,40,4A,42,43,49,48,4C,4E
Sequence_End
;REFERENCE:
;
; TEST TEST DESCRIPTION
; 4 Latch
; 5 Hystersis
; 6 Head switch
; 7 Check AFC weights
; 8 PES screen and RRO ZAP
; 9 ROM Flashing
; B Seek Settling Adaption
; C Adaptive notch resonance analysis Test
; D Adaptive notch resonance analysis Test
; E Constant Velocity Seek test (test for frictional torque)
; F Decon/Depop/VSS Scheme for Pes screen test
; 10 MR offset tuning VGA
; 11 Write current tuning
; 13 WP tuning for all zones
; 14 Read Bias head degradation test
; 15 VGA tuning
; 16 Capacity tuning
; 17 Variable Spare Sector tuning
; 18 Write Precomp at zone 7
; 19 VGA tuning
; 1A FB and FC tuning
; 1B FB and FC tuning
; 1C WP tuning for all zones
; 1D MR offset tuning BER
; 1E VGA tuning
; 1F Head data collection
; 20 Access time
; 21 Generate AT zone related settings
; 23 Start-stop / Time to ready
; 24 Latch Exerciser
; 25 Track Encroachment
; 26 Wide head test
; 27,28 Seek Error Rate
; 29 Two Point Seek Test
; 2A Drive Model Name Modification
; 2B Servo VGA tuning
; 2C Skew setting test
; 2D Reskew drive at AT rom age (use as a diagnostic command)
; 30 Build defect table
; 31,32 Normal Defect scan
; 33 PES Summary Test
; 34,38 Super Sector Scan Summary Test
; 35,36 Normal Defect Scan Summary Test
; 37 Left Adjacent Sector Padding
; 39 Super Sector Scan for Short & Deep Defect
; 3A Super Sector Scan for Wide & Shallow Defect
; 3B Circumferential Scratch Padding and Filling
; 3C Log Analysis
; 3D Radial Scratch Padding and Filling
; 3E Build Final Defect Table
; 3F AT Rom Flashing
; 40 ROM Head Map Flashing, Cert/AT secondary overlays check
; 41 Parameters for error limits
; 42 Error rate by zone/by head
; 43 ECC
; 44 Sequential Read Pass
; 46 Data transfer rate
; 48 Seek Error Rate
; 49 Head data collection
; 4A Random Write/Read
; 4B ID Read
; 4C Read Pack
; 4D Read/Compare 00 pattern
; 4E Log checking / Log summary
Parameters_Start:
TEST_04
MAX_KICK_LIMIT dw 7FFFH
Test_Freq dw 0DC0H
TEST_05
TEST_06
OD_CYL dw 0500H
MD_CYL dw 6000H
ID_CYL dw D989H
HDSW_STTL_LIM dw 6046H
OFFTRACK_CRIT dw 0700H
AM_TIME_CRIT dw 0070H
TEST_07
Param1 dw 0001H
TEST_08
PES_Space dw 0083H
Full_Retry dw 27FFH
Read_Retry dw 00FFH
Write_Retry dw 0080H
Test_First_Cyl dw 007CH
Test_First_Hd dw 0080H
Test_First_Offset dw 0000H
PeakThld dw 0200H
Settle_Delay dw 0000H
FirstLoop_Zap dw 0211H
LoopBack dw FFFBH
CSPT_BYTE_SIZE_ENTRY db 13
TOO_CLOSE db 03
MAX_ZAPS db 05
FIRST_SCAN_LOOP db 02
MIN_COUNT_TO_ZAP db 03
Test_THRESH_COUNT db 03
MAX_RETEST db 04
MAX_ZAP_TRIES db 10
GOOD_BEFORE_ZAP2 db 10
MAXCYLINDERSKIP db 168
SECOND_SCAN_LOOP db 05
NO_PESHARM_CRT db 03
NO_PESVEL_CRT db 03
MAXERRCOUNTLIM db 03
CSPT_WORD_SIZE_ENTRY db 6
PESTHRESHOLD dw 74
RETEST_PESTHRESHOLD dw 85
FIRST_PESCHK_ML dw FFFFh
FIRST_VELCHK_ML dw FFFFh
SECOND_PESCHK_ML dw FFFFh
SECOND_VELCHK_ML dw FFFFh
TEST_09
Flashing dw FFFFH
TEST_0B
SETTLESKLENGTH dw 0200H
SETTLEAVGCNT dw 0040H
RESSCRNCNT db 04
MAXGAINITERATION db 03
SETTLECNTLIMIT db 48H
SETTLECNTGAIN db 30H
TESTGAIN dw 2805H
BadTrkLimit db 32H
TotalKaCntLimit db 06
TEST_0C
ODTrackScanned dw 1000H
MDTrackScanned dw 6000H
IDTrackScanned dw C000H
FirstNotchFreq dw 44H
SecondNotchFreq dw 4BH
ThirdNotchFreq dw 61H
FourthNotchFreq dw 7EH
Disturbance dw 1
TEST_0D
ODTrackScanned dw 1000H
MDTrackScanned dw 6000H
IDTrackScanned dw C000H
FirstNotchFreq dw 44H
SecondNotchFreq dw 4BH
ThirdNotchFreq dw 61H
FourthNotchFreq dw 7EH
Disturbance dw 1
TEST_0E
space dw 0002H
Retry_control dw 0000H
Read_Retry dw 0000H
Write_Retry dw 0006H
pattern1 dw 3333H
pattern2 dw 3333H
FailIfLessThanOrEquTodw 0025H
TestZone dw 0007H
FailMRAZoneThreshold dw 000DH
TEST_0F
FeatureFlag db 62H ;bit 7-ZBP, bit 6-STP, bit 5-VSS Chk
;bit 4-VSSSS, bit 1 & 0-DECON
Reserved db 00H
PadTrk1 dw 010AH
PadTrk2 dw 020FH
PadTrk3 dw 0317H
PadTrk4 dw 0425H
PadTrk5 dw 00FFH
PadTrk6 dw 0012H
PadTrk7 dw 0016H
PadTrk8 dw 001FH
PadTrk9 dw 0022H
PadTrk10 dw 00FFH
Decon_Type dw DECDH
TEST_10
ODID_Head dw 0FFFFH
ODID_Zone dw 0FFFFH
ODID_Debug dw 00000H
Tune_Retry dw 0000FH
TEST_11
WC_START_END_RANGE dw 0001EH
WC_WGT_ZONE dw 00701H
WC_START_END_BPI dw 00808H
Tune_Retry dw 0000FH
TEST_12
Threshold dw 000AH
TEST_13
Start_Total_WP dw 0000BH
Mod_Zone dw 0011DH
Reserved db 00000H
Tune_Retry dw 0000FH
TEST_14
pattern1 dw 0000H
pattern2 dw 0000H
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
TestTrk dw 100H
ReadPerHdCount dw 300H
MaxERDrop dw 20
IminVTC db 20H
IminSTM db 48H
TEST_15
Reserve dw 00000H
Reserve dw 00000H
StepSize_StepCount dw 0081EH
Tune_Retry dw 0000FH
TEST_16
QUICKTUNE_CAPACITY dw 08001H
TOLERANCE_ZONE dw 08101H
START_END_BPI dw 00412H
Tune_Retry dw 0000FH
TEST_17
FeatureFlag db 10H ;bit 4-VSSSS
Reserved db 00H
TEST_18
WC_START_END_RANGE dw 0001EH
WC_WGT_ZONE dw 00701H
WC_START_END_BPI dw 00000H
Tune_Retry dw 0000FH
TEST_19
Reserve dw 00000H
Reserve dw 00000H
StepSize_StepCount dw 0081EH
Tune_Retry dw 0000FH
TEST_1A
Start_Total_FC dw 00030H
Mod_Zone dw 0021DH
Start_Total_FB dw 00070H
Tune_Retry dw 0000FH
TEST_1B
Start_Total_FC dw 00030H
Mod_Zone dw 0021DH
Start_Total_FB dw 00070H
Tune_Retry dw 0000FH
TEST_1C
Start_Total_WP dw 0000BH
Mod_Zone dw 0011DH
Reserved db 00000H
Tune_Retry dw 0000FH
TEST_1D
ODID_Head dw 0FFFFH
ODID_Zone dw 0FFFFH
ODID_Debug dw 0880FH
Tune_Retry dw 0000FH
TEST_1E
Reserve dw 00000H
Reserve dw 00000H
StepSize_StepCount dw 0081EH
Tune_Retry dw 0000FH
TEST_1F
Info_zone dw 0001H
noise_range dw 0010H
read_per_noise dw 00FFH
Tune_Retry dw 0000H
TEST_20
acctm1 db 3
len_1_low db 1
len_1_high db 0
acctm2 db 3
len_2_low db 2
len_2_high db 0
acctm4 db 4
len_4_low db 4
len_4_high db 0
acctm8 db 6
len_8_low db 8
len_8_high db 0
acctm16 db 6
len_16_low db 16
len_16_high db 0
acctm32 db 7
len_32_low db 32
len_32_high db 0
acctm64 db 8
len_64_low db 64
len_64_high db 0
acctm128 db 9
len_128_low db 128
len_128_high db 0
acctm1/3 db 18
len_1/3_low db CBH
len_1/3_high db 0EH
acctm_max db 34
len_max_low db 5EH
len_max_high db 2CH
end db 0
acctm_rdm db 17
TEST_21
TEST_22
NumberOfSkip dw 25
TEST_23
Loop_count ddw 28
SpinUpDelay dw 1EH
ReadyLimit dw 78H
TEST_24
pattern1 dw 0000H
pattern2 dw 0000H
Retry_control dw BF93H
Read_Retry dw 34H
Write_Retry dw 80H
OneHdr_lpcnt db 9h
TwoHdr_lpcnt db 5h
ThreeHdr_lpcnt db 4h
FourHdr_lpcnt db 3h
TEST_25
pattern1 dw 0000H
pattern2 dw 0000H
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
TestTrk dw 100H
ReadPerHdCount dw 300H
WritePerHdCount dw 500H
MaxERDrop dw 250
AbsoluteLimit dw 10
TEST_26
Retry_Control dw 00H
Read_Retry dw 00H
Write_Retry dw 80H
LAST_OT_SQUEEZE dw 28H
DiffLimit dw 25H
WedgeWriteCnt dw 02H
TrkTest1 dw 80H
TrkTest1 dw 7000H
TrkTest1 dw D800H
TrkTest1 dw FFFFH
TEST_27
Pattern1 dw 0000H
Pattern2 dw 0000H
Retry_Control dw 8003H
Read_Retry dw 5H
Write_Retry dw 80H
ReadCounter dw 100H
FirstValue dw 00H
SecondValue dw 19H
ThirdValue dw 1AH
TEST_28
space dw 0007H
MIN_CYL dw 007CH
MAX_CYL dw 0D993H
NO_OF_CYLS dw 61A8H
Loop_count ddw 0DH
SkLimit dw 00
TEST_29
DESIGNATE_TRK1 dw 0100H
DESIGNATE_TRK2 dw D000H
SEEK_NUMBER dw 2160H
SEEK_COUNT ddw 0006H
TWO_POINT_SEEK_SCHEMEdw 0FFFFH
TEST_2A
ModelType dw 00E0H
1_Header dw 3331H;'312A'
dw 3241H
2_Header dw 3031H;'010A'
dw 3041H
3_Header dw 3032H;'025A'
dw 3541H
4_Header dw 3032H;'022A'
dw 3241H
TEST_2B
TEST_2C
CylSkew db 19H ;1 hdr
HeadSkew db 16H
CylSkew db 16H ;2 hdr
HeadSkew db 16H
CylSkew db 16H ;3 hdr
HeadSkew db 16H
CylSkew db 16H ;4 hdr
HeadSkew db 16H
TEST_2D
TEST_2E
Retry_control dw 0001H
Read_Retry dw 0001H
Write_Retry dw 0003H
BERThres_WRCount dw 0530H
StepSize_Reduction dw 0202H
TuneTrkPerZone dw 0001H
End_Start_Zone dw 0707H
TEST_2F
Retry_control dw FF93H
Read_Retry dw 0006H
Write_Retry dw 0080H
TA_Threshold dw 0053H
DetectedTA_Fail_Countdw 0010H
Target_Trk dw 0100H
TEST_30
FeatureFlag db 0C0H ;bit 7-ZBP, bit 6-STP, bit 5-VSS Chk
;bit 1 & 0-DECON
Reserved db 00H
PadTrk1 dw 0206H
PadTrk2 dw 050AH
PadTrk3 dw 080EH
PadTrk4 dw 0910H
PadTrk5 dw 00FFH
PadTrk6 dw 0012H
PadTrk7 dw 0016H
PadTrk8 dw 001FH
PadTrk9 dw 0022H
PadTrk10 dw 00FFH
Decon_Type dw 0000
TEST_31
Retry_control dw 0001H
Read_Retry dw 0002H
Write_Retry dw 0003H
pattern1 dw 0000H
pattern2 dw 0000H
stress1 dw 0000H;0%
stress2 db 00H ;Bit 1 = offtrk
depopflag db 00H
TEST_32
Retry_control dw 0001H
Read_Retry dw 0001H
Write_Retry dw 0006H
pattern1 dw FF00H
pattern2 dw FFFFH
HdLoopCnt dw D918H
Start_hd_zone dw 0001H
reserve1 dw 00H
TEST_33
LogSummary dw 0008H
TEST_34
LogSummary dw 0039H
ZoneLimit dw FFFFH
HeadLimit dw FFFFH
TEST_35
LogSummary dw 0031H
ZoneLimit dw FFFFH
HeadLimit dw FFFFH
TEST_36
LogSummary dw 0032H
ZoneLimit dw FFFFH
HeadLimit dw FFFFH
TEST_37
FillSkipTrk dw 0004H
Radialscrlimit dw 1203H
Circumscrlimit dw 1203H
RadialPad1 dw 0001H
RadialPad2 dw 0107H
RadialPad3 dw 181FH
RadialPad4 dw 3628H
RadialPad5 dw 5450H
RadialPad6 dw FF59H
CircumPad1 dw 0002H
CircumPad2 dw 0104H
CircumPad3 dw 0506H
CircumPad4 dw 0808H
CircumPad5 dw 100AH
CircumPad6 dw FF0CH
TEST_38
LogSummary dw 003AH
ZoneLimit dw FFFFH
HeadLimit dw FFFFH
TEST_39
space dw 0002H
Retry_control dw 0000H
Read_Retry dw 0000H
Write_Retry dw 0006H
pattern1 dw 3333H
pattern2 dw 3333H
stress1 dw 0000H;Bit 15 set => do not build defect
stress2 db 00H
depopflag db 00H
TEST_3A
space dw 0002H
Retry_control dw 0000H
Read_Retry dw 0000H
Write_Retry dw 0006H
pattern1 dw 3333H
pattern2 dw 3333H
stress1 dw 0000H
stress2 db 00H
depopflag db 00H
TEST_3B
FillSkipTrk dw 0004H
Radialscrlimit dw 1203H
Circumscrlimit dw 1203H
RadialPad1 dw 0001H
RadialPad2 dw 0107H
RadialPad3 dw 181FH
RadialPad4 dw 3628H
RadialPad5 dw 5450H
RadialPad6 dw FF59H
CircumPad1 dw 0002H
CircumPad2 dw 0104H
CircumPad3 dw 0506H
CircumPad4 dw 0808H
CircumPad5 dw 100AH
CircumPad6 dw FF0CH
TEST_3C
Reserved dw 0000H
Reserved dw 0000H
TEST_3D
FillSkipTrk dw 0004H
Radialscrlimit dw 1203H
Circumscrlimit dw 1203H
RadialPad1 dw 0001H
RadialPad2 dw 0107H
RadialPad3 dw 181FH
RadialPad4 dw 3628H
RadialPad5 dw 5450H
RadialPad6 dw FF59H
CircumPad1 dw 0002H
CircumPad2 dw 0104H
CircumPad3 dw 0506H
CircumPad4 dw 0808H
CircumPad5 dw 100AH
CircumPad6 dw FF0CH
TEST_3E
FeatureFlag db 01H ;bit 0-AdvLog
Reserved db 00H
TEST_3F
TEST_40
Flashing dw 0000H
Compensation_HotCold dw 1E3CH
TEST_41 ;Default Error Rate Limits
Reserved db 00H
Minrdbits db 66H
Minrdhrdbits db 66H
Minrdfrmbits db 5FH
Minrdsftbits db 5AH
Minrdotfbits db 3CH
Minrdrawbits db 28H
Minrdhdrbits db 00H
Minwrbits db 5CH
Minwrhrdbits db 5CH
Minwrrtybits db 41H
Minwrhdrbits db 00H
TEST_42 ;Seq. Write/Read with ER Limits check
Retry_control dw BF93H
Read_Retry dw 34H
Write_Retry dw 80H
Pattern1 dw 0000H
Pattern2 dw 0000H
Methodology dw 81H
TEST_43 ;ECC Test
pattern1 dw 0000H
pattern2 dw 0000H
Space dw 00H
OD_Test_Cyl dw 100H
ID_Test_Cyl dw D000H
TEST_44 ;Seq. Write/Read with ER Limits check
Retry_control dw BF93H
Read_Retry dw 34H
Write_Retry dw 80H
Pattern1 dw 0000H
Pattern2 dw 0000H
Methodology dw 21H
TEST_45 ;Random Wr/Rd using Q cmd
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
pattern1 dw 0000H
pattern2 dw 0000H
Space dw 07H
BeginCyl dw 3000H
EndCyl dw 445BH
LoopCount ddw 249F0H
TEST_46 ;Thruput Test
pattern1 dw 0000H
pattern2 dw 0000H
Test_cyl_zone dw 100H
TEST_47
pattern1 dw 0000H
pattern2 dw 0000H
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
TestTrk dw 100H
ReadPerHdCount dw 300H
WritePerHdCount dw 500H
MaxERDrop dw 30
AbsoluteLimit dw 40
TEST_48
space dw 0006H
MIN_CYL dw 007CH
MAX_CYL dw 0D993H
NO_OF_CYLS dw 61A8H
Loop_count ddw 01H
SkLimit dw 31
TEST_49
Info_zone dw 0001H
TEST_4A ;Random Write/Read
pattern1 dw 0000H
pattern2 dw FFFFH
MinCyl dw 007CH
MaxCyl dw 07D0H
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
WriteLoopCount dw 3A0H
ReadLoopCount dw 550H
TEST_4B ;ID Read
Space dw 07H
Retry_control dw F7FFH
Read_Retry dw FFH
Write_Retry dw 80H
Loop_count ddw 200
TEST_4C ;Seq. Read Pack
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
pattern1 dw 0000H
pattern2 dw 0000H
Space dw 03H
Op_code dw 02H
TEST_4D
Retry_control dw F7FFH
Read_Retry dw 67H
Write_Retry dw 80H
pattern1 dw 0000H
pattern2 dw 0000H
TestZone dw 01H
ReadLoopCount dw 64H
NextTestZone dw 80H
TEST_4E
NoOfBogusReassignEntrydw 4
CylInterval dw 2000
TEST_51 ;Zone Error Rate Limits (Test42)
Reserved db 00H
Minrdbits db 66H
Minrdhrdbits db 66H
Minrdfrmbits db 58H
Minrdsftbits db 55H
Minrdotfbits db 3CH
Minrdrawbits db 37H
Minrdhdrbits db 00H
Minwrbits db 5CH
Minwrhrdbits db 5CH
Minwrrtybits db 41H
Minwrhdrbits db 00H
TEST_52 ;Please ensure total no. of bytes is even
Test00LogSize dw 1
Test01LogSize dw 8
Test02LogSize dw 255
Test03LogSize dw 127
Test04LogSize dw 16
Test05LogSize dw 4
Test06LogSize dw 24
Test07LogSize dw 4
Test08LogSize dw 255
Test09LogSize dw 1
Test0ALogSize dw 20
Test0BLogSize dw 8
Test0CLogSize dw 60
Test0DLogSize dw 60
Test0ELogSize dw 10
Test0FLogSize dw 255
Test10LogSize dw 64
Test11LogSize dw 64
Test12LogSize dw 8
Test13LogSize dw 127
Test14LogSize dw 8
Test15LogSize dw 64
Test16LogSize dw 80
Test17LogSize dw 127
Test18LogSize dw 64
Test19LogSize dw 64
Test1ALogSize dw 127
Test1BLogSize dw 127
Test1CLogSize dw 127
Test1DLogSize dw 64
Test1ELogSize dw 64
Test1FLogSize dw 2
Test20LogSize dw 6
Test21LogSize dw 8
Test22LogSize dw 16
Test23LogSize dw 64
Test24LogSize dw 10
Test25LogSize dw 24
Test26LogSize dw 48
Test27LogSize dw 48
Test28LogSize dw 8
Test29LogSize dw 24
Test2ALogSize dw 4
Test2BLogSize dw 1
Test2CLogSize dw 1
Test2DLogSize dw 4
Test2ELogSize dw 8
Test2FLogSize dw 64
Test30LogSize dw 255
Test31LogSize dw 255
Test32LogSize dw 255
Test33LogSize dw 24
Test34LogSize dw 24
Test35LogSize dw 24
Test36LogSize dw 24
Test37LogSize dw 255
Test38LogSize dw 255
Test39LogSize dw 255
Test3ALogSize dw 255
Test3BLogSize dw 255
Test3CLogSize dw 255
Test3DLogSize dw 255
Test3ELogSize dw 255
Test3FLogSize dw 4
Test40LogSize dw 4
Test41LogSize dw 0
Test42LogSize dw 80
Test43LogSize dw 6
Test44LogSize dw 40
Test45LogSize dw 10
Test46LogSize dw 4
Test47LogSize dw 18
Test48LogSize dw 24
Test49LogSize dw 2
Test4ALogSize dw 12
Test4BLogSize dw 4
Test4CLogSize dw 4
Test4DLogSize dw 4
Test4ELogSize dw 8
Test4FLogSize dw 0
Test50LogSize dw 0
Test51LogSize dw 0
Test52LogSize dw 0
Test53LogSize dw 0
Test54LogSize dw 20
Test55LogSize dw 0
Test56LogSize dw 4
Test57LogSize dw 0
Test58LogSize dw 0
Test59LogSize dw 0
Test5ALogSize dw 0
Test5BLogSize dw 0
Test5CLogSize dw 0
Test5DLogSize dw 0
Test5ELogSize dw 0
Test5FLogSize dw 0
Test60LogSize dw 8
Test61LogSize dw 8
Test62LogSize dw 8
Test63LogSize dw 8
Test64LogSize dw 8
Test65LogSize dw 8
Test66LogSize dw 8
Test67LogSize dw 8
Test68LogSize dw 127
Test69LogSize dw 64
Test6ALogSize dw 64
Test6BLogSize dw 64
Test6CLogSize dw 64
Test6DLogSize dw 64
Test6ELogSize dw 64
Test6FLogSize dw 0
Test70LogSize dw 0
Reserved dw 0
Parameters_End 很多时修大家修盘会发现加载LDR和RAM都成功。但是里面的磁头数不对，SA也可能报错，磁头数通常变成8个，我们可以这样修，先进行写测试，如果通不过。就检查SA，没问题的话，就写38。39。4F，然后退出，不断电，再时进去，这时就可以认盘了，如果还不能认盘，就换固件了，如果还不行，就写MT11模块，再复位，再退出。再进，认盘了，断电看看，OK了。 gikhu[;pko['p 看贴回贴，好人好报，支持发贴。恭喜发财。` 很多时修大家修盘会发现加载LDR和RAM都成功。但是里面的磁头数不对，SA也可能报错，磁头数通常变成8个，我们可以这样修，先进行写测试，如果通不过。就检查SA，没问题的话，就写38。39。4F，然后退出，不断电，再时进去，这时就可以认盘了，如果还不能认盘，就换固件了，如果还不行，就写MT11模块，再复位，再退出。再进，认盘了，断电看看，OK了。 看看 看看 看看 看看 看看 看看 看看 看看 看看 看看 看看 什么呀，学习，看看
U6SF流程 学习